Hinalea 4455 XSWIR

Hinalea 4455 XSWIR
Features

    Hinalea Model 4455 is an Extended SWIR (XSWIR) hyperspectral imaging sensor built on front‑staring Fabry‑Perot technology. Compact size, lightweight and highly portable, it covers 1120‑2100 nm with integrated hardware‑and‑software for lab, production‑line and field‑deployed applications.

  • Extended SWIR (XSWIR) Detection: Covers 1120‑2100 nm with 225 spectral bands and 15 nm (FWHM) spectral resolution for material identification in long‑wave SWIR region
  • Fast Data‑cube Acquisition with Dynamic Band Selection: Captures full high‑spatial‑resolution hyperspectral data‑cubes within seconds. Users may select only subsets of bands to optimize acquisition and processing efficiency
  • Superior Image Uniformity: Eliminates typical image‑uniformity limitations found in line‑scanning and patterned‑filter snapshot multispectral imagers for consistent frame‑wide image quality
  • Compact, Lightweight & Easy Deployment: Small form factor, lightweight and cost effective design with high mounting flexibility, compatible with various payload platforms
  • Powerful Proprietary Software Suite:Dedicated application software supports fast hyper‑cube capture, intuitive image classification, segmentation and comprehensive spectral‑image exploration tools
Specifications
Hinalea 4455 XSWIR
Dimensions (LxWxH) 80 mm × 80 mm × 264 mm
Weight (Mass) ~2.72 kg (~6 lb.)
Input voltage 110 VAC / 60 Hz or 220 VAC / 50 Hz
Data interfaces USB-C / USB 3.0, Gigabit Ethernet / IEEE 802.3 1000BASE-T, IEEE 802.3af (PoE)
Operating temperature 15 °C ~ 30 °C
Humidity 65% non-condensing
Standard lens 100 mm FL, 30 degree FOV
Sensor spatial resolution 636 x 508 pixels
Spectral range Designed for ~1120 nm to 2100 nm
Spectral bands 225
Spectral resolution ~15 nm
Dynamic range User selectable; 8- or 16-bit
Illumination Optional
Applications
Agriculture & Food Science
Materials Science & Industrial Inspection
Pharmaceuticals & Chemical Industry
Environmental Monitoring
Security & Detection
Military
Scientific / Academic Research